ISSN

2231-3915 (Online)
2231-3907 (Print)


Articles in Volume - 10, Issue - 2

Online Since: Thursday, Dec 31, 2020     [ Views: 15470 ]

Author(s): Pragati D. Tayade, S.P. Trikal

DOI: 10.5958/2231-3915.2020.00022.X

Views: 84 (pdf),       2862 (html)

Access: Open Access

Cite: Pragati D. Tayade, S.P. Trikal. Optimization Of Machining Parameters For Surface Finish Of EN 42 Alloy Steel For End Milling Operation Using Taguchi Method. Int. J. Tech. 2020; 10(2): 115-121. doi: 10.5958/2231-3915.2020.00022.X


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Author(s): Anil Kumar

DOI: 10.5958/2231-3915.2020.00023.1

Views: 1 (pdf),       2893 (html)

Access: Open Access

Cite: Anil Kumar. Wavelet Analytical Study of Ramganga River Water Quality and its Extended Behaviour. Int. J. Tech. 2020;10(2):122-128. doi: 10.5958/2231-3915.2020.00023.1


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Author(s): Rajeev Kumar, Sivadhar Sharma

DOI: 10.5958/2231-3915.2020.00024.3

Views: 8 (pdf),       2844 (html)

Access: Open Access

Cite: Rajeev Kumar, Sivadhar Sharma. Synthesis and Characterizarion of Copper (II) and Copper (III) Complexes of Pyrrole-Appended Oxacarbaporphyrin. Int. J. Tech. 2020; 10(2):129-137. doi: 10.5958/2231-3915.2020.00024.3


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Author(s): Siddharth Nayak, Shivani Verma, Deepak Kumar Deshmukh

DOI: 10.5958/2231-3915.2020.00025.5

Views: 56 (pdf),       3413 (html)

Access: Open Access

Cite: Siddharth Nayak, Shivani Verma, Deepak Kumar Deshmukh. Cyber Security using data Mining Techniques: A Survey. Int. J. Tech. 2020; 10(2):138-142. doi: 10.5958/2231-3915.2020.00025.5


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Author(s): Aamir Hasan, V. K. Patle

DOI: 10.5958/2231-3915.2020.00026.7

Views: 59 (pdf),       3233 (html)

Access: Open Access

Cite: Aamir Hasan, V. K. Patle. Security Threats in Perception and Network Layer of Internet of Things (IoT): A Review. Int.J.Tech.2020;10(2): 143-152. doi: 10.5958/2231-3915.2020.00026.7


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International Journal of Technology (IJT) is an international, peer-reviewed journal, research journal aiming at promoting and publishing original high quality research in all disciplines of engineering sciences and technology...... Read more >>>

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DOI: 10.5958/2231-3915 


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